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in situ tracking

Electrochromic Os-based metallo-supramolecular polymer: electronic state tracking by in situ XAFS, IR, and impedance measurements


Takefumi Yoshida, Manas Kumar Bera,Yemineni S L V Narayana, Sanjoy Mondal, Hitoshi Abe and Masayoshi Higuchi


The electronic state of Os-based metallo-supramolecular polymers (poly(OsL)2+) during the electrochromic (EC) changes was tracked by in situ X-ray absorption fine structure (XAFS), infrared (IR) spectra, and impedance measurements. The XAFS measurement suggested the electronic charge migration in the polymer and the in situ measurements revealed the reversible changes by the electrochemical redox. The IR spectrum showed the IVCT band in the polymer and we also confirmed the reversible changes by applying a voltage. In the impedance measurements, we found the drastic decrease of charge transfer resistance (RCT) in the polymer film near the electrochemical redox potential.



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